ToF-SIMS observation of PTFE surfaces modified by α-particle irradiation

• Published in: Surface and interface analysis Vol. 37; no. 9; pp. 713 - 720
• Main Authors: Fisher, Gregory L., Ohlhausen, James A., Wetteland, Christopher J.
• Format: Journal Article
• Language: English
• Published: Chichester, UK John Wiley & Sons, Ltd 01-09-2005; Wiley
• Subjects: Atomic, molecular, and ion beam impact and interactions with surfaces; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Electron and ion emission by liquids and solids; impact phenomena; Exact sciences and technology; Impact phenomena (including electron spectra and sputtering); ionizing radiation; Materials science; Physics; Polymers, organic compounds; PTFE; Radiation effects on specific materials; Solid surfaces and solid-solid interfaces; Structure of solids and liquids; crystallography; surface modification; Surface structure and topography; Surface treatments; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); ToF-SIMS; α-particle; Polytetrafluoroethylene; Alpha irradiation; Physical radiation effects; PTFE; surface modification; Time-of-flight method; Surface treatments; Fragmentation; Surface structure; ToF-SIMS; Cross-linking; SIMS; α-particle; ionizing radiation
• ISSN: 0142-2421; 1096-9918
• DOI: 10.1002/sia.2068

The surface structure of polytetrafluoroethylene (PTFE) upon α‐particle irradiation has been investigated at doses in the range of 1 × 107 to 1 × 1011 Rad and compared with the surface structure of the unirradiated polymer. Both neat and 25% fiberglass content PTFE were studied. The samples, maintained at nominal room temperature, were irradiated in vacuum by 5.5 MeV 4He2+ ions generated in a tandem accelerator beam line. Static time‐of‐flight SIMS (ToF‐SIMS) was employed to probe chemical changes at the surface as a function of the irradiation level.
In general, the data are indicative of increased cross‐linking at α‐doses less than 1 × 109 Rad, followed by increased fragmentation and unsaturation at α‐doses greater than 1 × 109 Rad. Throughout the irradiation regime, scission is a constant factor promoting cross‐linking, branching, and unsaturation. However, at α‐doses greater than 1 × 1010 Rad, extreme structural degradation of the polymer becomes evident and is accompanied by conversion to oxygen‐functionalized and aliphatic compounds. Thus, for PTFE in an α‐particle field, an upper exposure limit of ∼1010 Rad is essential for nominal retention of molecular structure. Finally, a quantitative relationship between α‐dose and characteristic fragment ion intensity is developed. Copyright © 2005 John Wiley & Sons, Ltd.