Surface leakage investigation via gated type-II InAs/GaSb long-wavelength infrared photodetectors

• Published in: Applied physics letters Vol. 101; no. 21
• Main Authors: Chen, G., Huang, E. K., Hoang, A. M., Bogdanov, S., Darvish, S. R., Razeghi, M.
• Format: Journal Article
• Language: English
• Published: 19-11-2012
• Subjects: Bias; Density; Gating and risering; Infrared; Leakage; Passivation; Photodetectors; Silicon dioxide
• ISSN: 0003-6951; 1077-3118
• DOI: 10.1063/1.4767905

By using gating technique, surface leakage generated by SiO2 passivation in long-wavelength infrared type-II superlattice photodetector is suppressed, and different surface leakage mechanisms are disclosed. By reducing the SiO2 passivation layer thickness, the saturated gated bias is reduced to -4.5 V. At 77 K, dark current densities of gated devices are reduced by more than 2 orders of magnitude, with 3071 Omega cm2 differential-resistance-area product at -100 mV. With quantum efficiency of 50%, the 11 mu m 50% cut-off gated photodiode has a specific detectivity of 7 1011 Jones, and the detectivity stays above 2 1011 Jones from 0 to -500 mV operation bias.