Sub-wavelength microscopy of surface plasmon oscillations and their statistical properties

• Published in: Surface science Vol. 582; no. 1; pp. 110 - 116
• Main Authors: Kroo, N., Szentirmay, Zs, Walther, H.
• Format: Journal Article
• Language: English
• Published: Lausanne Elsevier B.V 10-05-2005; Amsterdam Elsevier Science; New York, NY
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Physics; Quantum optics of plasmon emission; Sub-wavelength microscopy of surface plasmons; Surface plasmons; Sub-wavelength microscopy of surface plasmons; Surface plasmons; Quantum optics of plasmon emission; Quantum optics
• ISSN: 0039-6028; 1879-2758
• DOI: 10.1016/j.susc.2005.02.056

Near-field microscopy of plasmons generated in different layer structures is performed by means of a scanning tunnelling microscope. The signal fluctuations are statistically evaluated for the first time. The direct plasmon signal shows a narrow Gaussian or Poisson-like distribution, whereas the thermal signal of the plasmon oscillation corresponds to a Boltzmann-type distribution as expected for a signal of thermal origin. The width of the direct plasmon signal corresponds in most cases to the width expected for an ideal Poissonian or is narrower. If the signal fluctuations resulted uniquely from intensity variations in time, this would indicate reduced shot noise. Unfortunately, the setup cannot separate the fluctuations due to location and time. Nevertheless, the results indicate that further investigations on the statistics of plasmon would be interesting.