Refractory material SIS junction structures
Niobium based SIS junction structures for microwave receiving devices were investigated. The possibility of the mixing efficiency improving for Nb-Al 2 O 3 -Nb junctions with a negative resistance on I-V curve near the gap voltage has been demonstrated. Comparative microwave investigation of the par...
Saved in:
Published in: | IEEE transactions on magnetics Vol. 23; no. 2; pp. 684 - 687 |
---|---|
Main Authors: | , , , , , , , |
Format: | Journal Article Conference Proceeding |
Language: | English |
Published: |
New York, NY
IEEE
01-03-1987
Institute of Electrical and Electronics Engineers |
Subjects: | |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Summary: | Niobium based SIS junction structures for microwave receiving devices were investigated. The possibility of the mixing efficiency improving for Nb-Al 2 O 3 -Nb junctions with a negative resistance on I-V curve near the gap voltage has been demonstrated. Comparative microwave investigation of the parallel and series DC biased arrays shows the advantage of the first one. SIS junction capacitance has been compensated with microstrip or lumped elements at the signal frequency. Such compensated structures were investigated at frequencies 38 and 76 GHz both in waveguide and quasioptic systems. |
---|---|
Bibliography: | SourceType-Scholarly Journals-2 ObjectType-Feature-2 ObjectType-Conference Paper-1 content type line 23 SourceType-Conference Papers & Proceedings-1 ObjectType-Article-3 ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 |
ISSN: | 0018-9464 1941-0069 |
DOI: | 10.1109/TMAG.1987.1065119 |