Miniaturized UWB Filters Integrated With Tunable Notch Filters Using a Silicon-Based Integrated Passive Device Technology

This paper reports on the implementation of miniaturized ultra-wideband filters integrated with tunable notch filters using a silicon-based integrated passive device technology. An ultra-wideband bandpass filter is realized on a micromachined silicon substrate, showing an insertion loss of 1.1 dB, r...

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Bibliographic Details
Published in:IEEE transactions on microwave theory and techniques Vol. 60; no. 3; pp. 518 - 527
Main Authors: Zhengzheng Wu, Shim, Yonghyun, Rais-Zadeh, M.
Format: Journal Article
Language:English
Published: New York, NY IEEE 01-03-2012
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:This paper reports on the implementation of miniaturized ultra-wideband filters integrated with tunable notch filters using a silicon-based integrated passive device technology. An ultra-wideband bandpass filter is realized on a micromachined silicon substrate, showing an insertion loss of 1.1 dB, return loss of better than 15 dB, and attenuation of more than 30 dB at both lower and upper stop-bands, with a spurious-free response up to 40 GHz. The filter occupies only 2.9 mm 2.4 mm of die area. To address the in-band interference issues associated with ultra-wideband communication, very compact tunable notch filters are monolithically integrated with the bandpass filters. A two-pole tunable notch filter integrated with an ultra-wideband filter provides more than 20 dB rejection in the 5-6 GHz range to reject U-NII interferences, with a total footprint of 4.8 mm 2.9 mm. The power handling, linearity, and temperature stability of filters are characterized and presented in this paper.
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content type line 23
ISSN:0018-9480
1557-9670
DOI:10.1109/TMTT.2011.2178428