Miniaturized UWB Filters Integrated With Tunable Notch Filters Using a Silicon-Based Integrated Passive Device Technology
This paper reports on the implementation of miniaturized ultra-wideband filters integrated with tunable notch filters using a silicon-based integrated passive device technology. An ultra-wideband bandpass filter is realized on a micromachined silicon substrate, showing an insertion loss of 1.1 dB, r...
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Published in: | IEEE transactions on microwave theory and techniques Vol. 60; no. 3; pp. 518 - 527 |
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Main Authors: | , , |
Format: | Journal Article |
Language: | English |
Published: |
New York, NY
IEEE
01-03-2012
Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects: | |
Online Access: | Get full text |
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Summary: | This paper reports on the implementation of miniaturized ultra-wideband filters integrated with tunable notch filters using a silicon-based integrated passive device technology. An ultra-wideband bandpass filter is realized on a micromachined silicon substrate, showing an insertion loss of 1.1 dB, return loss of better than 15 dB, and attenuation of more than 30 dB at both lower and upper stop-bands, with a spurious-free response up to 40 GHz. The filter occupies only 2.9 mm 2.4 mm of die area. To address the in-band interference issues associated with ultra-wideband communication, very compact tunable notch filters are monolithically integrated with the bandpass filters. A two-pole tunable notch filter integrated with an ultra-wideband filter provides more than 20 dB rejection in the 5-6 GHz range to reject U-NII interferences, with a total footprint of 4.8 mm 2.9 mm. The power handling, linearity, and temperature stability of filters are characterized and presented in this paper. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0018-9480 1557-9670 |
DOI: | 10.1109/TMTT.2011.2178428 |