Quantitative phase retrieval with picosecond X-ray pulses from the ATF Inverse Compton Scattering source

• Published in: Optics express Vol. 19; no. 3; pp. 2748 - 2753
• Main Authors: Endrizzi, M, Gureyev, T E, Delogu, P, Oliva, P, Golosio, B, Carpinelli, M, Pogorelsky, I, Yakimenko, V, Bottigli, U
• Format: Journal Article
• Language: English
• Published: United States 31-01-2011
• Subjects: accelerator test facility; ACCELERATORS; BNL; COMPTON EFFECT; GEOMETRY; PARTICLE ACCELERATORS; Phase retrieval; POLYMERS; Radiometry - methods; Scattering, Radiation; THICKNESS; X-ray imaging; X-RAY SOURCES; X-Rays
• ISSN: 1094-4087; 1094-4087
• DOI: 10.1364/OE.19.002748

Quantitative phase retrieval is experimentally demonstrated using the Inverse Compton Scattering X-ray source available at the Accelerator Test Facility (ATF) in the Brookhaven National Laboratory. Phase-contrast images are collected using in-line geometry, with a single X-ray pulse of approximate duration of one picosecond. The projected thickness of homogeneous samples of various polymers is recovered quantitatively from the time-averaged intensity of transmitted X-rays. The data are in good agreement with the expectations showing that ATF Inverse Compton Scattering source is suitable for performing phase-sensitive quantitative X-ray imaging on the picosecond scale. The method shows promise for quantitative imaging of fast dynamic phenomena.