Analysis of Quasi-Monoenergetic Neutron and Proton SEU Cross Sections for Terrestrial Applications

• Published in: IEEE transactions on nuclear science Vol. 53; no. 4; pp. 1890 - 1896
• Main Authors: Lambert, D., Baggio, J., Hubert, G., Paillet, P., Girard, S., Ferlet-Cavrois, V., Flament, O., Saigne, F., Boch, J., Sagnes, B., Buard, N., Carriere, T.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01-08-2006; The Institute of Electrical and Electronics Engineers, Inc. (IEEE); Institute of Electrical and Electronics Engineers
• Subjects: Aerospace electronics; Analytical models; Bulk technologies; Circuit testing; Cross sections; Electronics; Energy (nuclear); Engineering Sciences; Error analysis; Interference; Mathematical analysis; neutron and proton effects; Neutrons; Nuclear cross sections; Packaging; Particle beams; Protons; Simulation; Single event upset; Single event upsets; single-event upset (SEU); soft error rate (SER); Soft errors; Bulk technologies; neutron and proton effects; soft error rate (SER); single-event upset (SEU)
• ISSN: 0018-9499; 1558-1578
• DOI: 10.1109/TNS.2006.880935

This paper investigates the single event upset sensitivity of Bulk SRAMs for terrestrial applications. The technology sensitivity is analyzed with both quasi-monoenergetic neutron and proton experiments in an energy range from 14 to 180 MeV. Analytical and simulation based correction methods of the neutron cross section are presented and validated. Then, neutron and proton cross section are compared. Soft Error Rate (for the terrestrial neutron spectrum) calculated with either proton or quasi-monoenergetic neutron data are also presented and compared