Features of MIS Structures Based on Insulating PbSnTe:In Films with the Composition in the Vicinity of the Band Inversion Related to Their Ferroelectric Properties

The characteristics of metal-insulator-semiconductor (MIS) structures based on insulating PbSnTe:In films with compositions in the vicinity of band inversion grown by molecular-beam epitaxy (MBE) are studied. It is shown that a number of features of the films can be due to a ferroelectric phase tran...

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Bibliographic Details
Published in:Semiconductors (Woodbury, N.Y.) Vol. 54; no. 10; pp. 1325 - 1331
Main Authors: Klimov, A. E., Akimov, A. N., Akhundov, I. O., Golyashov, V. A., Gorshkov, D. V., Ishchenko, D. V., Matyushenko, E. V., Neizvestny, I. G., Sidorov, G. Yu, Suprun, S. P., Tarasov, A. S., Tereshchenko, O. E., Epov, V.S.
Format: Journal Article
Language:English
Published: Moscow Pleiades Publishing 01-10-2020
Springer
Springer Nature B.V
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Summary:The characteristics of metal-insulator-semiconductor (MIS) structures based on insulating PbSnTe:In films with compositions in the vicinity of band inversion grown by molecular-beam epitaxy (MBE) are studied. It is shown that a number of features of the films can be due to a ferroelectric phase transition with a Curie temperature in the range of about T ≈ 15–20 K.
ISSN:1063-7826
1090-6479
DOI:10.1134/S1063782620100164