Failure Morphology After Drop Impact Test of Ball Grid Array (BGA) Package With Lead-Free Sn-3.8Ag-0.7Cu and Eutectic SnPb Solders

• Published in: IEEE transactions on electronics packaging manufacturing Vol. 30; no. 1; pp. 49 - 53
• Main Authors: Jin-Wook Jang, De Silva, A.P., Drye, J.E., Post, S.L., Owens, N.L., Jong-Kai Lin, Frear, D.R.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01-01-2007; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Arrays; BGA; Capacitive sensors; Electronics packaging; Environmentally friendly manufacturing techniques; Eutectics; Failure; Impact tests; Intermetallic; Lead; Metallization; Morphology; Packages; Packaging; Performance evaluation; reliability; Sn Alloy; soldering; Solders; Testing; Tin; Tin base alloys
• ISSN: 1521-334X; 1558-0822
• DOI: 10.1109/TEPM.2006.890643

High strain-rate drop impact tests were performed on ball grid array (BGA) packages with solder compositions of (in wt%) Sn-3.8Ag-0.7Cu (SnAgCu) and eutectic Sn-37Pb (SnPb). Solder balls were joined to the metallizations of plated Ni on the device side and plated Cu on the board side. The BGA packages were tested at 1500 g within 0.5 ms, resulting in an imposed bending strain of 0.2-0.3%. Both SnAgCu and SnPb joints failed at the interface at the device side but the detailed failure morphology differed significantly. The crack location for the eutectic SnPb was primarily through the solder and seldom extended through an entire bump. The SnPb joints also exhibited bulk solder deformation. The SnAgCu joints showed extremely brittle behavior with an interfacial failure at the (Ni,Cu) 3 Sn 4 intermetallics/Ni under bump metallization (UBM) interface. The strain rate sensitivity of bulk solder defines the drop test performance and the eutectic SnPb solder showed better drop impact performance due to a less strain rate sensitivity