Sensor fault estimation and tolerant control for Itô stochastic systems with a descriptor sliding mode approach

• Published in: Automatica (Oxford) Vol. 49; no. 5; pp. 1242 - 1250
• Main Authors: Liu, Ming, Shi, Peng
• Format: Journal Article
• Language: English
• Published: Kidlington Elsevier Ltd 01-05-2013; Elsevier
• Subjects: Adaptative systems; Applied sciences; Computer science; control theory; systems; Control system synthesis; Control theory. Systems; Exact sciences and technology; Fault estimation; Fault-tolerant control; Integral sliding mode control; Itô stochastic system; Modelling and identification; Sensor fault; Sliding mode observer; Integral sliding mode control; Sensor fault; Sliding mode observer; Fault estimation; Itô stochastic system; Fault-tolerant control; Itô equation; Descriptor system; Error estimation; Sliding mode; Non linear control; Control synthesis; State space; Stochastic system; Stochastic integral; Fault tolerance; Apparatus failure; System identification; State estimation; Measurement error; Fault tolerant system; Estimation error; Variable structure control; State space method; Non linear system; Reachability; Integral control
• ISSN: 0005-1098; 1873-2836
• DOI: 10.1016/j.automatica.2013.01.030

This paper investigates the problem of fault estimation and fault-tolerant control against sensor failures for a class of nonlinear Itô stochastic systems with simultaneous input and output disturbances. By using a new descriptor sliding mode approach, an accurate estimation of the system states, fault vector and disturbances can be obtained simultaneously. Based on the state estimates, an integral-type sliding mode control scheme against faults and disturbances is proposed to stabilize the resulting fault system. It is shown that the reachabilities of the proposed sliding mode surfaces can be guaranteed in both the state estimate space and the estimation error space simultaneously under the designed control schemes. Finally, a numerical example is presented to illustrate the effectiveness and applicability of the proposed technique.