Metrological support to parameter measurement for nanoparticles in technological media

• Published in: Measurement techniques Vol. 52; no. 5; pp. 449 - 458
• Main Authors: Krasovskii, P. A., Karpov, O. V., Balakhanov, D. M., Lesnikov, E. V.
• Format: Journal Article
• Language: English
• Published: Boston Springer US 01-05-2009; Springer Nature B.V
• Subjects: Analytical Chemistry; Brownian motion; Characterization and Evaluation of Materials; Lasers; Measurement Science and Instrumentation; Measurement techniques; Microscopy; Nanometrology; Nanoparticles; Particle size; Physical Chemistry; Physics; Physics and Astronomy; Radiation; Studies; X-rays; parameter measurement; metrological suite; nanoparticles
• ISSN: 0543-1972; 1573-8906
• DOI: 10.1007/s11018-009-9307-2

Methods are considered for measuring the parameters of nanoparticles in natural and technological media as used in the nanoindustry. Exact monitoring is required for the parameters of the medium where the nanoparticles are suspended in order to obtain reliable measurement data. Measurement methods are examined for the nanoparticle size range 5–100 nm for aqueous and gaseous media in order to set up a metrological suite for measuring the parameters of nanoparticles in these media.