On board electronic devices safety provided by DICE-based Muller C-elements

• Published in: Acta astronautica Vol. 150; pp. 28 - 32
• Main Authors: Danilov, I.A., Gorbunov, M.S., Shnaider, A.I., Balbekov, A.O., Rogatkin, Y.B., Bobkov, S.G.
• Format: Journal Article
• Language: English
• Published: Elmsford Elsevier Ltd 01-09-2018; Elsevier BV
• Subjects: Asynchronous circuits; C-element; CMOS; Computer simulation; Dual interlocked cell; Electronic components; Electronic devices; Extraterrestrial radiation; Flight simulation; Navigation; Navigation systems; Radiation; Radiation hardening by design; Safety; Single event upset; Single event upsets; Soft error; Space exploration; Space missions; Radiation hardening by design; Dual interlocked cell; C-element; Soft error; Single event upset; Asynchronous circuits
• ISSN: 0094-5765; 1879-2030
• DOI: 10.1016/j.actaastro.2018.01.019

Space radiation interacting with electronic components of on-board computing or navigation unit can bring to it's malfunction. Using error tolerant electronic components is a key factor ensuring safety of Space missions. The Muller C-element is one of the main part of the asynchronous circuits and also can be found in synchronous ones. Being sequential by its nature, it is vulnerable to single event upsets. We propose three CMOS circuit implementations of a soft error tolerant Muller C-element, whose tolerance is achieved by using of the well-known DICE-principle and is proved by SPICE simulations.