Time and momentum resolved resonant magnetic x-ray diffraction on EuTe

Time and momentum resolved resonant magnetic x-ray diffraction on EuTe

We used fs- and ps- resonant magnetic x-ray diffraction to probe the laser-induced changes to the magnetic profile In thin films of the antiferromagnetic netic semicon-ductor EuTe.

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Bibliographic Details
Published in:EPJ Web of conferences Vol. 41; pp. 3014 - np
Main Authors: Trabant, C., Pontius, N., Schierle, E., Weschke, E., Kachel, T., Springholz, G., Holldack, K., Föhlisch, A., Schüßler-Langeheine, C.
Format: Journal Article
Language:English
Published: EDP Sciences 01-01-2013
Subjects:
Antiferromagnetism
Diffraction
Thin films
X-rays
Online Access:Get full text
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Description
Summary:We used fs- and ps- resonant magnetic x-ray diffraction to probe the laser-induced changes to the magnetic profile In thin films of the antiferromagnetic netic semicon-ductor EuTe.
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ISBN:9782759809561
2759809560
ISSN:2100-014X
2100-014X
DOI:10.1051/epjconf/20134103014