Scaling law in carbon nanotube electromechanical devices

• Published in: Physical review letters Vol. 95; no. 18; pp. 185504.1 - 185504.4
• Main Authors: LEFEVRE, R, GOFFMAN, M. F, DERYCKE, V, MIKO, C, FORRO, L, BOURGOIN, J. P, HESTO, P
• Format: Journal Article
• Language: English
• Published: Ridge, NY American Physical Society 28-10-2005
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Dielectrics, piezoelectrics, and ferroelectrics and their properties; Exact sciences and technology; Physics; Piezoelectricity and electromechanical effects; Carbon nanotubes; Atomic force microscopy; Nanoelectromechanical device; Scaling laws; Electromechanical properties
• ISSN: 0031-9007; 1079-7114
• DOI: 10.1103/PhysRevLett.95.185504

We report a method for probing electromechanical properties of multiwalled carbon nanotubes (CNTs). This method is based on atomic force microscopy measurements on a doubly clamped suspended CNT electrostatically deflected by a gate electrode. We measure the maximum deflection as a function of the applied gate voltage. Data from different CNTs scale into an universal curve within the experimental accuracy, in agreement with a continuum model prediction. This method and the general validity of the scaling law constitute a very useful tool for designing actuators and in general conducting nanowire-based nanoelectromechanical systems.