On the general properties of polarised light conventional and confocal microscopes

• Published in: Optics communications Vol. 148; no. 4; pp. 300 - 315
• Main Authors: Török, P., Higdon, P.D., Wilson, T.
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 15-03-1998; Elsevier Science
• Subjects: Confocal microscopy; Conventional optical microscopes; Diffraction; Exact sciences and technology; Focusing; Fundamental areas of phenomenology (including applications); Geometrical optics; High-aperture; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Optical instruments, equipment and techniques; Optics; Physics; Scanning optical microscopy; Vectorial theory; Wave fronts and ray tracing; High-aperture; Scanning optical microscopy; Confocal microscopy; Diffraction; Focusing; Vectorial theory; Field distribution; Theoretical study; Scanning light microscopy; Ray tracing; Optical systems; Numerical method; Polarized light
• ISSN: 0030-4018; 1873-0310
• DOI: 10.1016/S0030-4018(97)00576-2

This paper considers the general properties of polarising microscopes and, in particular, light polarisation changes produced by high aperture lenses. A method is suggested for vectorial ray tracing of complex optical systems and to model high aperture lenses. The two principal arrangements of polarising microscopes (linearly and circularly polarised) are also considered. We discuss the effect of pinhole size on the detected intensity. A theory for point resolution of these microscopes is also presented and results are analysed. We support our theoretical predictions with experimental data.