Oxygen isotopic tracer measurements in ceramics and ceramic composites with a fine focus gallium primary ion gun

Oxygen isotopic tracer measurements in ceramics and ceramic composites with a fine focus gallium primary ion gun

The tracer oxygen technique has been applied to polycrystalline ceramic and ceramic composites developed for high temperature electrochemical devices with SIMS analysis using a fine focus LMIS primary ion gun. The oxygen tracer distribution in non-uniform and inhomogeneous structures is quantitative...

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Bibliographic Details
Published in:Applied surface science Vol. 231; pp. 834 - 839
Main Authors: Chater, R.J, McPhail, D.S
Format: Journal Article
Language:English
Published: Elsevier B.V 15-06-2004
Subjects:
Ceramics
Gallium gun
Imaging SIMS
Isotopic
Oxygen
Isotopic
Oxygen
Gallium gun
Ceramics
Imaging SIMS
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Summary:The tracer oxygen technique has been applied to polycrystalline ceramic and ceramic composites developed for high temperature electrochemical devices with SIMS analysis using a fine focus LMIS primary ion gun. The oxygen tracer distribution in non-uniform and inhomogeneous structures is quantitatively measured by sequential mass spectra and secondary ion imaging on in situ selected and prepared bevel surfaces.
Bibliography:SourceType-Scholarly Journals-2
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ObjectType-Conference Paper-1
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SourceType-Conference Papers & Proceedings-1
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ISSN:0169-4332
1873-5584
DOI:10.1016/j.apsusc.2004.03.135