Write current dependence of transition noise in thin film media

Complex behavior of the noise in thin-film recording media is observed with regard to its dependency on bulk magnetic parameters, recording density, write current, and alloy composition. The pattern of this complex behaviour is the results of the writing process and thus reflects only the bulk magne...

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Bibliographic Details
Published in:IEEE transactions on magnetics Vol. 26; no. 1; pp. 121 - 123
Main Authors: Lee, S.Y., Pressesky, J.L., Williams, D., Heiman, N.
Format: Journal Article
Language:English
Published: New York, NY IEEE 01-01-1990
Institute of Electrical and Electronics Engineers
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Summary:Complex behavior of the noise in thin-film recording media is observed with regard to its dependency on bulk magnetic parameters, recording density, write current, and alloy composition. The pattern of this complex behaviour is the results of the writing process and thus reflects only the bulk magnetic properties of the medium, whereas the amplitude of the noise voltage is seen to be associated with the nature of the magnetic alloy films.< >
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ISSN:0018-9464
1941-0069
DOI:10.1109/20.50509