CAMAC staggered memory look-up module and ECL fan-in for fast trigger applications

• Published in: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 39; no. 4; pp. 848 - 852
• Main Authors: Rosenfeld, C., Wang, A.T.M., Wilson, S.R., Zheng, L.Y., Broome, K.W.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: United States IEEE 01-08-1992
• Subjects: 990200 > Mathematics & Computers; ACCELERATOR FACILITIES; Astronomy; BEAMS; CAMAC; CAMAC SYSTEM; Chromium; COLLIDING BEAMS; DESIGN; DEVELOPED COUNTRIES; ELECTRONIC CIRCUITS; GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE; LOGIC CIRCUITS; NORTH AMERICA; PARTICLE ACCELERATORS; Pattern recognition; Physics; Programmable logic devices; Random access memory; Read-write memory; Registers; SOUTH CAROLINA; TARGET CHAMBERS; TEST FACILITIES; Testing; USA 430303 > Particle Accelerators > Experimental Facilities & Equipment
• ISSN: 0018-9499; 1558-1578
• DOI: 10.1109/23.159719

The authors describe a recently designed CAMAC dual-port memory look-up module. The target application of this design was geometric pattern recognition in the trigger system of a collider experiment. The resulting module, however, has quite general applicability and expands considerably on the functionality of the LeCroy Model 2372. A high-density emitter-coupled-logic (ECL) fan-in module is discussed. This module can be manually configured to compute logical sums and products, and in effect functions as an ECL erasable programmable logic device.< >