CVD diamond photoconductors for picosecond radiation pulse characterisation

• Published in: Diamond and related materials Vol. 5; no. 6; pp. 732 - 736
• Main Authors: Foulon, F., Bergonzo, P., Jany, C., Gicquel, A., Pochet, T.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 01-05-1996; Elsevier
• Subjects: Applied sciences; CVD diamond film; Electronics; Exact sciences and technology; Optoelectronic devices; Photoconductor; Radiation; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Texture; Photoconductor; CVD diamond film; Texture; Radiation; keV range; Shape; Polycrystal; Photoconductor materials; Diamond; X ray; Experimental study; Photodetector; CVD; keV range 10-100; Ultraviolet radiation; Visible radiation; Infrared radiation; Manufacturing; Impulse; ps range
• ISSN: 0925-9635; 1879-0062
• DOI: 10.1016/0925-9635(95)00466-1

〈100〉-, 〈110〉- and non-textured polycrystalline diamond films deposited by microwave plasma enhanced chemical vapour deposition (MPCVD) have been used for the fabrication of resistive photoconductors. Such detectors can be used to measure the intensity and the temporal shape of pulsed radiation such as IR, visible, UV and X-ray. The photodetectors were characterised under fast pulsed Nd:Yag laser radiation (λ = 266, 532 and 1064 nm, 30 ps FWHM) and steady state X-ray (40 keV). Detector pulsed signals having FWHM in the range 350–600 ps were obtained. Film texture and nitrogen concentration in the film are found to have a significant influence on the detector response time and on carrier lifetime.