In situ high-pressure X-ray diffraction study of densification of a molecular chalcogenide glass
Structural mechanisms of densification of a molecular chalcogenide glass of composition Ge 2.5As 51.25S 46.25 have been studied in situ at pressures ranging from 1 atm to 11 GPa at ambient temperature as well as ex situ on a sample quenched from 12 GPa and ambient temperature using high-energy X-ray...
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Published in: | The Journal of physics and chemistry of solids Vol. 69; no. 9; pp. 2336 - 2340 |
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Main Authors: | , , , , , , , |
Format: | Journal Article Conference Proceeding |
Language: | English |
Published: |
Oxford
Elsevier Ltd
01-09-2008
Elsevier |
Subjects: | |
Online Access: | Get full text |
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Summary: | Structural mechanisms of densification of a molecular chalcogenide glass of composition Ge
2.5As
51.25S
46.25 have been studied
in situ at pressures ranging from 1
atm to 11
GPa at ambient temperature as well as
ex situ on a sample quenched from 12
GPa and ambient temperature using high-energy X-ray diffraction. The X-ray structure factors display a reduction in height of the first sharp diffraction peak and a growth of the principal diffraction peak with a concomitant shift to higher
Q-values with increasing pressure. At low pressures of at least up to 5
GPa the densification of the structure primarily involves an increase in the packing of the As
4S
3 molecules. At higher pressures the As
4S
3 molecules break up and reconnect to form a high-density network with increased extended-range ordering at the highest pressure of 11
GPa indicating a structural transition. This high-density network structure relaxes only slightly on decompression indicating that the pressure-induced structural changes are quenchable. |
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ISSN: | 0022-3697 1879-2553 |
DOI: | 10.1016/j.jpcs.2008.04.004 |