In situ high-pressure X-ray diffraction study of densification of a molecular chalcogenide glass

Structural mechanisms of densification of a molecular chalcogenide glass of composition Ge 2.5As 51.25S 46.25 have been studied in situ at pressures ranging from 1 atm to 11 GPa at ambient temperature as well as ex situ on a sample quenched from 12 GPa and ambient temperature using high-energy X-ray...

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Bibliographic Details
Published in:The Journal of physics and chemistry of solids Vol. 69; no. 9; pp. 2336 - 2340
Main Authors: Soyer Uzun, S., Gaudio, S.J., Sen, S., Mei, Q., Benmore, C.J., Tulk, C.A., Xu, J., Aitken, B.G.
Format: Journal Article Conference Proceeding
Language:English
Published: Oxford Elsevier Ltd 01-09-2008
Elsevier
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Summary:Structural mechanisms of densification of a molecular chalcogenide glass of composition Ge 2.5As 51.25S 46.25 have been studied in situ at pressures ranging from 1 atm to 11 GPa at ambient temperature as well as ex situ on a sample quenched from 12 GPa and ambient temperature using high-energy X-ray diffraction. The X-ray structure factors display a reduction in height of the first sharp diffraction peak and a growth of the principal diffraction peak with a concomitant shift to higher Q-values with increasing pressure. At low pressures of at least up to 5 GPa the densification of the structure primarily involves an increase in the packing of the As 4S 3 molecules. At higher pressures the As 4S 3 molecules break up and reconnect to form a high-density network with increased extended-range ordering at the highest pressure of 11 GPa indicating a structural transition. This high-density network structure relaxes only slightly on decompression indicating that the pressure-induced structural changes are quenchable.
ISSN:0022-3697
1879-2553
DOI:10.1016/j.jpcs.2008.04.004