Experimental observation of phase transitions of a deformed Dicke model using a reconfigurable, bi-parametric electronic platform
We experimentally study the infinite-size limit of the Dicke model of quantum optics with a parity-breaking deformation strength that couples the system to an external bosonic reservoir. We focus on the dynamical consequences of such symmetry breaking, which makes the classical phase space asymmetri...
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Published in: | European physical journal plus Vol. 138; no. 9; p. 775 |
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Main Authors: | , , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
Berlin/Heidelberg
Springer Berlin Heidelberg
01-09-2023
Springer Nature B.V |
Subjects: | |
Online Access: | Get full text |
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Summary: | We experimentally study the infinite-size limit of the Dicke model of quantum optics with a parity-breaking deformation strength that couples the system to an external bosonic reservoir. We focus on the dynamical consequences of such symmetry breaking, which makes the classical phase space asymmetric with non-equivalent energy wells. We present an experimental implementation of the classical version of the deformed Dicke model using a state-of-the-art bi-parametric electronic platform. Our platform constitutes a playground for studying representative phenomena of the deformed Dicke model in electrical circuits with the possibility of externally controlling parameters and initial conditions. In particular, we investigate the dynamics of the ground state, various phase transitions and the asymmetry of the energy wells as a function of the coupling strength
γ
and the deformation strength
α
in the resonant case. Additionally, to characterize the various behavior regimes, we present a two-dimensional phase diagram as a function of the two intrinsic system parameters. The onset of chaos is also analyzed experimentally. Our findings provide a clear connection between theoretical predictions and experimental observations, demonstrating the usefulness of our bi-parametric electronic setup. |
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ISSN: | 2190-5444 2190-5444 |
DOI: | 10.1140/epjp/s13360-023-04391-6 |