Reflectance properties of silicon moth-eyes in response to variations in angle of incidence, polarisation and azimuth orientation

We report a study of the optical properties of silicon moth-eye structures using a custom-made fully automated broadband spectroscopic reflectometry system (goniometer). This measurement system is able to measure specular reflectance as a function of wavelength, polar incidence angle and azimuth ori...

Full description

Saved in:
Bibliographic Details
Published in:Optics express Vol. 22 Suppl 2; no. S2; pp. A402 - A415
Main Authors: Asadollahbaik, Asa, Boden, Stuart A, Charlton, Martin D B, Payne, David N R, Cox, Simon, Bagnall, Darren M
Format: Journal Article
Language:English
Published: United States 10-03-2014
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We report a study of the optical properties of silicon moth-eye structures using a custom-made fully automated broadband spectroscopic reflectometry system (goniometer). This measurement system is able to measure specular reflectance as a function of wavelength, polar incidence angle and azimuth orientation angle, from normal to near-parallel polar incidence angle. The system uses a linear polarized broadband super-continuum laser light source. It is shown that a moth-eye structure composed of a regular array of protruding silicon rods, with finite sidewall angle reduces reflectance and sensitivity to incident wavelength in comparison to truly cylindrical rods with perpendicular sidewalls. It is also shown that moth-eye structures have omnidirectional reflectance properties in response to azimuth orientation of the sample. The importance of applying the reflectometer setup to study the optical properties of solar cell antireflective structures is highlighted.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.22.00A402