Photoelectron spectroscopy and secondary ion mass spectrometry characterization of diamond-like carbon films

Photoelectron spectroscopy at different photon energies was used to optimize the photoexcitation cross section for valence band study of diamond-like hydrogenated carbon films. The electronic states of diamond-like carbon (DLC) were studied by synchrotron radiation photoelectron spectroscopy and ult...

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Bibliographic Details
Published in:Thin solid films Vol. 515; no. 13; pp. 5386 - 5390
Main Authors: MATOLIN, V, MATOLINOVA, I, VELTRUSKA, K, MASEK, K
Format: Journal Article
Language:English
Published: Lausanne Elsevier B.V 07-05-2007
Elsevier Science
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Summary:Photoelectron spectroscopy at different photon energies was used to optimize the photoexcitation cross section for valence band study of diamond-like hydrogenated carbon films. The electronic states of diamond-like carbon (DLC) were studied by synchrotron radiation photoelectron spectroscopy and ultraviolet photoelectron spectroscopy. The valence band spectra measured at different excitation energies show the gradual emergence of the p– π band in relation to the sample annealing and ion bombardment amorphization. The p– π band of the annealed DLC was characterized by localized p z states whilst the formation of the amorphous carbon surface was accompanied by appearance of the delocalized p z states in the gap. Secondary ion mass spectrometry and thermal desorption spectroscopy showed that sample annealing was accompanied by hydrogen content decrease.
ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2006.12.028