Investigations on Ionizing Dose Deposition in Thin-Layered Devices: Sample-to-Sample Variability and Electronic Equilibrium Dependence

• Published in: IEEE transactions on nuclear science Vol. 70; no. 8; p. 1
• Main Authors: Gaillardin, Marc, Lambert, Damien, Girard, Sylvain, Aubert, Damien, Assaillit, Gilles, Morana, Adriana, Nobre-Tavares, Sophie, Meyer, Arnaud, Vidalot, Jeoffray, Delbos, Christophe, Paillet, Philippe, Ginibriere, Thierry, De Nardi, Roberto, Poujols, David
• Format: Journal Article
• Language: English
• Published: New York IEEE 01-08-2023; The Institute of Electrical and Electronics Engineers, Inc. (IEEE); Institute of Electrical and Electronics Engineers
• Subjects: <sup xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">60 Co; bremsstrahlung; bulk; Deposition; dose rate; Dosimeters; Dosimetry; Energy spectra; Engineering Sciences; gamma; ionizing dose pulse; LINAC; linear accelerator; Optical equipment; optical fiber; Optical fibers; Optoelectronic devices; ORIATRON; photodiode; Photons; PiN; Radiation; Radiation effects; radiation laboratory sources; Radiation measurement; Radiation tests; Radiation-Induced Attenuation; RIA; silicon; SiO<sub xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">2; Thickness; TID; Total Ionizing Dose; variability; x-rays
• ISSN: 0018-9499; 1558-1578
• DOI: 10.1109/TNS.2023.3239950

The impact of photon energy spectrum on dose deposition variability is investigated using dosimetry, charge collection experiments on electronic and opto-electronic devices, and Radiation-Induced Attenuation (RIA) measurements in optical fibers. Geant4 calculations are performed to discuss the influence of photon energy spectrum, sensitive layer thickness and of the irradiated material. Implications for radiation test of electronic and optical equipment are discussed to ensure the effective TID is reached in irradiated devices.