Modeling and Stability Analysis of Islanded DC Microgrids Under Droop Control
The stability of dc microgrids (MGs) depends on the control strategy adopted for each mode of operation. In an islanded operation mode, droop control is the basic method for bus voltage stabilization when there is no communication among the sources. In this paper, it is shown the consequences of dro...
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Published in: | IEEE transactions on power electronics Vol. 30; no. 8; pp. 4597 - 4607 |
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Main Authors: | , , , |
Format: | Journal Article |
Language: | English |
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01-08-2015
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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Abstract | The stability of dc microgrids (MGs) depends on the control strategy adopted for each mode of operation. In an islanded operation mode, droop control is the basic method for bus voltage stabilization when there is no communication among the sources. In this paper, it is shown the consequences of droop implementation on the voltage stability of dc power systems, whose loads are active and nonlinear, e.g., constant power loads. The set of parallel sources and their corresponding transmission lines are modeled by an ideal voltage source in series with an equivalent resistance and inductance. This approximate model allows performing a nonlinear stability analysis to predict the system qualitative behavior due to the reduced number of differential equations. Additionally, nonlinear analysis provides analytical stability conditions as a function of the model parameters and it leads to a design guideline to build reliable (MGs) based on safe operating regions. |
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AbstractList | The stability of dc microgrids (MGs) depends on the control strategy adopted for each mode of operation. In an islanded operation mode, droop control is the basic method for bus voltage stabilization when there is no communication among the sources. In this paper, it is shown the consequences of droop implementation on the voltage stability of dc power systems, whose loads are active and nonlinear, e.g., constant power loads. The set of parallel sources and their corresponding transmission lines are modeled by an ideal voltage source in series with an equivalent resistance and inductance. This approximate model allows performing a nonlinear stability analysis to predict the system qualitative behavior due to the reduced number of differential equations. Additionally, nonlinear analysis provides analytical stability conditions as a function of the model parameters and it leads to a design guideline to build reliable (MGs) based on safe operating regions. |
Author | Nobrega Tahim, Andre Pires Pagano, Daniel J. Lenz, Eduardo Stramosk, Vinicius |
Author_xml | – sequence: 1 givenname: Andre Pires surname: Nobrega Tahim fullname: Nobrega Tahim, Andre Pires email: andre.tahim@posgrad.ufsc.br organization: Dept. of Autom. & Syst., Fed. Univ. of Santa Catarina, Florianopolis, Brazil – sequence: 2 givenname: Daniel J. surname: Pagano fullname: Pagano, Daniel J. email: daniel.pagano@ufsc.br organization: Dept. of Autom. & Syst., Fed. Univ. of Santa Catarina, Florianopolis, Brazil – sequence: 3 givenname: Eduardo surname: Lenz fullname: Lenz, Eduardo email: eduardo.lenz@posgrad.ufsc.br organization: Dept. of Autom. & Syst., Fed. Univ. of Santa Catarina, Florianopolis, Brazil – sequence: 4 givenname: Vinicius surname: Stramosk fullname: Stramosk, Vinicius email: vinicius.stramosk@posgrad.ufsc.br organization: Dept. of Autom. & Syst., Fed. Univ. of Santa Catarina, Florianopolis, Brazil |
BookMark | eNpdkE9PwkAQxTcGE0H9AMbLJl68FGfa_dM9EkAlgWginJu63ZIlpYu75cC3dxuIB0-TvPm9ybw3IoPWtYaQB4QxIqiX9ed8OU4B2TjNBKDEKzJExTABBDkgQ8hznuRKZTdkFMIOIskBh2S1cpVpbLulZVvRr678to3tTnTSls0p2EBdTRehiUtT0dmUrqz2buttFegmap7OvHMHOnVt511zR67rsgnm_jJvyeZ1vp6-J8uPt8V0skx0loouUdKgrpk2kLGaQQpZzbjKRV6xtEad8qhJZKxCKUVeauACtFamTqWujFHZLXk-3z1493M0oSv2NmjTxD-NO4YChZRKgkAW0ad_6M4dfUzXUyJljHPGI4VnKqYLwZu6OHi7L_2pQCj6gou-4KIvuLgUHD2PZ481xvzxQoECprJfV5R2jA |
CODEN | ITPEE8 |
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ContentType | Journal Article |
Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Aug 2015 |
Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Aug 2015 |
DBID | 97E RIA RIE AAYXX CITATION 7SP 7TB 8FD FR3 JQ2 KR7 L7M F28 |
DOI | 10.1109/TPEL.2014.2360171 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005-present IEEE All-Society Periodicals Package (ASPP) 1998-Present IEEE Electronic Library Online CrossRef Electronics & Communications Abstracts Mechanical & Transportation Engineering Abstracts Technology Research Database Engineering Research Database ProQuest Computer Science Collection Civil Engineering Abstracts Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering |
DatabaseTitle | CrossRef Civil Engineering Abstracts Technology Research Database Mechanical & Transportation Engineering Abstracts Electronics & Communications Abstracts ProQuest Computer Science Collection Engineering Research Database Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering |
DatabaseTitleList | Civil Engineering Abstracts Civil Engineering Abstracts |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library Online url: http://ieeexplore.ieee.org/Xplore/DynWel.jsp sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 1941-0107 |
EndPage | 4607 |
ExternalDocumentID | 3621653821 10_1109_TPEL_2014_2360171 6909049 |
Genre | orig-research Feature |
GrantInformation_xml | – fundername: Improvement of Higher Education Personnel, Brazil |
GroupedDBID | -~X 0R~ 29I 3EH 4.4 5GY 5VS 6IK 97E AAJGR AASAJ ABFSI ABQJQ ABVLG ACGFO ACGFS ACIWK ACKIV AENEX AETIX AI. AIBXA AKJIK ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BKOMP BPEOZ CS3 DU5 E.L EBS EJD HZ~ H~9 ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 MS~ O9- OCL P2P PQQKQ RIA RIE RIG RNS RXW TAE TAF TN5 VH1 VJK XFK AAYXX CITATION 7SP 7TB 8FD FR3 JQ2 KR7 L7M F28 |
ID | FETCH-LOGICAL-c326t-97e1cf4ce034f40203f459868d42f1c254027144d17768ac0560cc9ef27cdee93 |
IEDL.DBID | RIE |
ISSN | 0885-8993 |
IngestDate | Fri Aug 16 02:34:26 EDT 2024 Thu Oct 10 16:16:31 EDT 2024 Fri Aug 23 02:13:12 EDT 2024 Wed Jun 26 19:22:07 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 8 |
Keywords | nonlinear stability analysis DC microgrid constant power load (CPL) Bifurcation analysis droop control |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c326t-97e1cf4ce034f40203f459868d42f1c254027144d17768ac0560cc9ef27cdee93 |
Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
PQID | 1662445545 |
PQPubID | 37080 |
PageCount | 11 |
ParticipantIDs | ieee_primary_6909049 proquest_miscellaneous_1677970614 proquest_journals_1662445545 crossref_primary_10_1109_TPEL_2014_2360171 |
PublicationCentury | 2000 |
PublicationDate | 2015-08-01 |
PublicationDateYYYYMMDD | 2015-08-01 |
PublicationDate_xml | – month: 08 year: 2015 text: 2015-08-01 day: 01 |
PublicationDecade | 2010 |
PublicationPlace | New York |
PublicationPlace_xml | – name: New York |
PublicationTitle | IEEE transactions on power electronics |
PublicationTitleAbbrev | TPEL |
PublicationYear | 2015 |
Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | ref13 guckenheimer (ref28) 1983 ref12 ref15 ref14 ref30 ref10 doedel (ref29) 1998 ref2 ref1 ref17 ref16 ref19 ref18 ref24 ref23 ref26 ref25 ref20 ref22 ref21 ref27 middlebrook (ref11) 0 ref8 ref7 ref9 ref4 ref3 ref6 ref5 |
References_xml | – year: 1983 ident: ref28 publication-title: Nonlinear Oscillations Dynamical Systems and Bifurcations of Vector Fields doi: 10.1007/978-1-4612-1140-2 contributor: fullname: guckenheimer – ident: ref23 doi: 10.1109/COBEP.2011.6085269 – ident: ref27 doi: 10.1109/TPWRD.2011.2158456 – ident: ref25 doi: 10.1109/TPEL.2012.2211619 – ident: ref13 doi: 10.1109/63.387992 – ident: ref9 doi: 10.1109/TIE.2009.2013748 – ident: ref14 doi: 10.1109/TPEL.2003.818822 – ident: ref7 doi: 10.1109/TPEL.2013.2266419 – ident: ref12 doi: 10.1109/63.46005 – ident: ref17 doi: 10.1109/TSG.2011.2162430 – ident: ref5 doi: 10.1109/TIE.2010.2066534 – ident: ref30 doi: 10.1007/s12346-011-0050-0 – year: 1998 ident: ref29 article-title: Auto 97: Continuation and bifurcation software for ordinary differential equations (with Homcont) contributor: fullname: doedel – ident: ref6 doi: 10.1109/TPEL.2012.2215055 – ident: ref1 doi: 10.1109/TPEL.2004.833453 – ident: ref18 doi: 10.1109/TSG.2012.2201965 – ident: ref26 doi: 10.1109/TVT.2006.877483 – year: 0 ident: ref11 article-title: Input filter considerations in design and application of switching regulators publication-title: Proc IEEE Ind Appl Annu Meeting contributor: fullname: middlebrook – ident: ref22 doi: 10.1109/TPEL.2010.2091285 – ident: ref8 doi: 10.1109/TPEL.2013.2257857 – ident: ref24 doi: 10.1109/CDC.2012.6426298 – ident: ref16 doi: 10.1109/TVT.2006.877483 – ident: ref10 doi: 10.1109/TPEL.2009.2025274 – ident: ref2 doi: 10.1109/TPEL.2010.2077682 – ident: ref21 doi: 10.1109/TPEL.2011.2127488 – ident: ref15 doi: 10.1109/ESTS.2005.1524694 – ident: ref19 doi: 10.1109/TIE.2007.896474 – ident: ref3 doi: 10.1109/OPTIM.2010.5510477 – ident: ref20 doi: 10.1109/TIE.2006.882012 – ident: ref4 doi: 10.1109/TPWRD.2013.2241083 |
SSID | ssj0014501 |
Score | 2.6200957 |
Snippet | The stability of dc microgrids (MGs) depends on the control strategy adopted for each mode of operation. In an islanded operation mode, droop control is the... |
SourceID | proquest crossref ieee |
SourceType | Aggregation Database Publisher |
StartPage | 4597 |
SubjectTerms | Analytical models bifurcation analysis constant power load (CPL) Construction DC microgrid Differential equations Direct current droop control Electric currents Electric potential Electric power Electric power grids Electricity distribution Integrated circuit modeling Load modeling Mathematical models nonlinear stability analysis Nonlinearity Power transmission lines Resistance Stability analysis Voltage Voltage control |
Title | Modeling and Stability Analysis of Islanded DC Microgrids Under Droop Control |
URI | https://ieeexplore.ieee.org/document/6909049 https://www.proquest.com/docview/1662445545 https://search.proquest.com/docview/1677970614 |
Volume | 30 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV07T8MwED5RJhh4I8pLRmJCBOrGjusR9aEOgJAAiS1K7DNiSStKB_49d05agWBhixQrie7Oue_zvQDOdZohuXGXyNKYRElUSZGVOim8Lcqe80GWXJw8fjT3L73BkNvkXC5rYRAxJp_hFV_GWL6fuDkflV0Tk7OEaFvQMrZX12otIwZKx1HHtGl0QhwibSKYsmOvnx6Gt5zEpa66acb9YX74oDhU5defOLqX0eb_PmwLNhoYKW5qvW_DClY7sP6tueAu3PGYMy42F0XlBYHKmAb7KRZtSMQkCDYIPgIXg76449S81_c3PxNxGJIYEKiein6dy74Hz6PhU3-cNMMTEkeI7COxBqULiseBqcAkMQ2Ke7H3vOoG6YgXEiElNuWlIcZROAJCHecshq5xHtGm-7BaTSo8AJFpNBz-S0mnKmS66KCVGFKZlrqUtmjDxUKc-bTukZFHbtGxOcs-Z9nnjezbsMvyWy5sRNeG44UC8mYXzXKZZYQ-CPDoNpwtb5P9c1CjqHAy5zXGWMO89vDvJx_BGr1f10l7x7D68T7HE2jN_Pw0WtAXkPXCHw |
link.rule.ids | 315,782,786,798,27933,27934,54767 |
linkProvider | IEEE |
linkToHtml | http://sdu.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LT-MwEB7xOMAeeCwguryMxGm1gbqx4_qI2qIiWoREkfYWJfYYcUkRpYf99zvjpNWi5cItUqzImvFkvs_zArjQaYbkxl0iS2MSJVElRVbqpPC2KLvOB1lycfLw0dz_7vYH3Cbn17IWBhFj8hle8mOM5fupm_NV2RUxOUuIdhXWtTKZqau1ljEDpeOwYzIbnRCLSJsYpmzbq8nDYMRpXOqyk2bcIeaDF4pjVf77F0cHc7P9ta3twFYDJMV1rfldWMHqO3z7p73gHox50BmXm4ui8oJgZUyE_SMWjUjENAg-EnwJLvo9MebkvOe3Fz8TcRyS6BOsfhW9Opt9H55uBpPeMGnGJySOMNl7Yg1KFxQPBFOBaWIaFHdj73rVCdIRMyRKSnzKS0Oco3AEhdrOWQwd4zyiTQ9grZpWeAgi02g4AJiSVlXIdNFGKzGkMi11KW3Rgp8LceavdZeMPLKLts1Z9jnLPm9k34I9lt9yYSO6FhwvFJA3djTLZZYR_iDIo1twvnxNFsBhjaLC6ZzXGGMNM9sfn3_5DDaGk_EoH93e3x3BJu1F1yl8x7D2_jbHE1id-flpPE1_AfYjxXA |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Modeling+and+Stability+Analysis+of+Islanded+DC+Microgrids+Under+Droop+Control&rft.jtitle=IEEE+transactions+on+power+electronics&rft.au=Nobrega+Tahim%2C+Andre+Pires&rft.au=Pagano%2C+Daniel+J.&rft.au=Lenz%2C+Eduardo&rft.au=Stramosk%2C+Vinicius&rft.date=2015-08-01&rft.pub=IEEE&rft.issn=0885-8993&rft.eissn=1941-0107&rft.volume=30&rft.issue=8&rft.spage=4597&rft.epage=4607&rft_id=info:doi/10.1109%2FTPEL.2014.2360171&rft.externalDocID=6909049 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0885-8993&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0885-8993&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0885-8993&client=summon |