A new model for the thermal oxidation kinetics of silicon
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Published in: | Journal of electronic materials Vol. 17; no. 4; pp. 263 - 272 |
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Main Authors: | , |
Format: | Journal Article |
Language: | English |
Published: |
New York, NY
Institute of Electrical and Electronics Engineers
01-07-1988
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Subjects: | |
Online Access: | Get full text |
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ISSN: | 0361-5235 1543-186X |
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DOI: | 10.1007/bf02652105 |