A new model for the thermal oxidation kinetics of silicon

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Bibliographic Details
Published in:Journal of electronic materials Vol. 17; no. 4; pp. 263 - 272
Main Authors: NICOLLIAN, E. H, REISMAN, A
Format: Journal Article
Language:English
Published: New York, NY Institute of Electrical and Electronics Engineers 01-07-1988
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Description
ISSN:0361-5235
1543-186X
DOI:10.1007/bf02652105