Measurement of in-plane strains using electronic speckle and electronic speckle-shearing pattern interferometry

• Published in: Journal of modern optics Vol. 43; no. 8; pp. 1577 - 1581
• Main Author: Rastogi, Pramod K.
• Format: Journal Article
• Language: English
• Published: London Taylor & Francis Group 01-08-1996; Taylor & Francis
• Subjects: Electron, positron and ion microscopes, electron diffractometers and related techniques; Exact sciences and technology; Fundamental areas of phenomenology (including applications); Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Measurement and testing methods; Measurement methods and techniques in continuum mechanics of solids; Physics; Solid mechanics; Structural and continuum mechanics; Shearing interferometer; Stress analysis; Electronic speckle interferometry; Thin sheet; Theoretical study; Measuring methods; Aluminium; Experimental study
• ISSN: 0950-0340; 1362-3044
• DOI: 10.1080/09500349608232830

This letter reports the application of the electronic speckle and electronic speckle-shearing pattern interferometry for determining the first-order partial derivatives of in-plane displacements. Two possibilities of obtaining the in-plane strain contours are described. Experimental results showing the in-plane strain and the in-plane shearing strain contours on a tensile test specimen are presented.