Signatures of direct double ionization under xuv radiation

Signatures of direct double ionization under xuv radiation

In anticipation of upcoming experiments on two-photon double ionization of atoms and particularly helium, under strong short-wavelength radiation sources (45 eV), we present quantitative signatures of direct two-photon double ejection, in the photoelectron spectrum (PES) and the peak power dependenc...

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Bibliographic Details
Published in:Physical review. A, Atomic, molecular, and optical physics Vol. 72; no. 1
Main Authors: Lambropoulos, P., Nikolopoulos, L. A. A., Makris, M. G.
Format: Journal Article
Language:English
Published: United States 01-07-2005
Subjects:
ATOMIC AND MOLECULAR PHYSICS
ATOMS
ELECTRON SPECTRA
EV RANGE
EXTREME ULTRAVIOLET RADIATION
HELIUM
LASER RADIATION
PHOTOELECTRON SPECTROSCOPY
PHOTOIONIZATION
PHOTON-ATOM COLLISIONS
PHOTONS
PULSES
RADIATION SOURCES
WAVELENGTHS
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Summary:In anticipation of upcoming experiments on two-photon double ionization of atoms and particularly helium, under strong short-wavelength radiation sources (45 eV), we present quantitative signatures of direct two-photon double ejection, in the photoelectron spectrum (PES) and the peak power dependence, that can be employed in the interpretation of related data. We show that the PES provides the cleanest signature of the process. An inflection (knee) in the laser power dependence of double ionization is also discernible, within a window of intensities that depends on the pulse duration and cross sections.
ISSN:1050-2947
1094-1622
DOI:10.1103/PhysRevA.72.013410