Fabrication of Small Reference Probe and Its Application

• Published in: IEEE transactions on instrumentation and measurement Vol. 56; no. 2; pp. 435 - 438
• Main Authors: Kang, No-Weon, Kang, Jin-Seob, Kim, Dae-Chan, Kim, Jeong-Hwan
• Format: Journal Article
• Language: English
• Published: New York IEEE 01-04-2007; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Antenna gain measurement; Antenna measurements; Antennas; Calibration; Design engineering; Electric field strength; Fabrication; field-strength meter; Frequency; Gain measurement; Instrumentation; Level control; Probes; Schottky diodes; Sensors; System testing; TEM cells; traceability; transfer instrument; Transmission electron microscopy; Waveguide antennas
• ISSN: 0018-9456; 1557-9662
• DOI: 10.1109/TIM.2007.890795

This paper presents a disk-type small reference probe operating up to 1 GHz as an electric field transfer sensor. The probe is calibrated using a mu-TEM cell and demonstrates a wide useable electric field strength range. Design and calibration methods are presented. The probe is suitable for testing and comparing the performances of reference field generation systems, both TEM cells and antennas. As an application, a technique for measuring the antenna gain is proposed and applied to open-ended waveguide antennas