Effect of (Co–TeO2-doped polyvinylpyrrolidone) organic interlayer on the electrophysical characteristics of Al/p-Si (MS) structures

• Published in: Journal of materials science. Materials in electronics Vol. 32; no. 17; pp. 21909 - 21922
• Main Authors: Farazin, Javid, Asl, Mehdi Shahedi, Pirgholi-Givi, Gholamreza, Delbari, Seyed Ali, Namini, Abbas Sabahi, Altındal, Şemsettin, Azizian-Kalandaragh, Yashar
• Format: Journal Article
• Language: English
• Published: New York Springer US 01-09-2021; Springer Nature B.V
• Subjects: Aluminum; Characterization and Evaluation of Materials; Chemistry and Materials Science; Electric fields; Frequency ranges; Interlayers; Materials Science; Nanostructure; Optical and Electronic Materials; Optical properties; Physics; Polymers; Polyvinylpyrrolidone; Silicon; Tellurium dioxide
• ISSN: 0957-4522; 1573-482X
• DOI: 10.1007/s10854-021-06544-8

In this paper, (Co–TeO
2
) nanostructures were synthesized using the microwave-assisted method for the fabrication of (PVP:Co–TeO
2
) as an organic interlayer (OI) at Al/p-Si interface. Structural and optical properties of nanostructures were investigated through XRD, SEM, EDX, and UV–Vis techniques. The interface states (
N
ss
) energy dependence diagram were also obtained from the voltage-dependent ideality factor (
n
) and barrier height (BH). Experimental results confirmed that the OI improved the performance of MS structure in respect of low
N
ss
,
R
s
,
n
, and high rectification rate (RR). Both the forward- and reverse-bias conduction mechanisms such as ohmic, space/trap-charge-limited current (SCLC/TCLC), and Poole–Frenkel/Schottky emission (PFE/SE), respectively, were implemented. Additionally, basic dielectric parameters of two structures were investigated in detail using impedance–frequency (
Z
–
f
) measurements in a wide frequency range (0.1–1000 kHz) and they were a strong function of frequency because of the existence of
N
ss
, surface polarization, and interlayer.