Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy

Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy

The guiding properties of polymer waveguides on a thin gold film are investigated in the optical regime. The details of propagation in the waveguides are studied simultaneously in the object and Fourier planes, providing direct measurement of both the real and imaginary parts of the effective index...

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Bibliographic Details
Published in:Applied physics letters Vol. 91; no. 24; pp. 243102 - 243102-3
Main Authors: Massenot, S., Grandidier, J., Bouhelier, A., Colas des Francs, G., Markey, L., Weeber, J.-C., Dereux, A., Renger, J., Gonzàlez, M. U., Quidant, R.
Format: Journal Article
Language:English
Published: American Institute of Physics 10-12-2007
Subjects:
Engineering Sciences
Optics
Photonic
Physics
SURFACE-PLASMONS
SCATTERING
OPTICS
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Summary:The guiding properties of polymer waveguides on a thin gold film are investigated in the optical regime. The details of propagation in the waveguides are studied simultaneously in the object and Fourier planes, providing direct measurement of both the real and imaginary parts of the effective index of the guided mode. A fair agreement between theoretical analysis provided by the differential method and experimental leakage radiation microscopy data is shown. All these tools bring valuable information for designing and understanding such devices.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2824840