Cosmic-ray immune latch circuit for 90nm technology and beyond

• Published in: 2004 IEEE International Solid-State Circuits Conference (IEEE Cat. No.04CH37519) pp. 492 - 493 Vol.1
• Main Authors: Arima, Y., Yamashita, T., Komatsu, Y., Fujimoto, T., Ishibashi, K.
• Format: Conference Proceeding
• Language: English
• Published: Piscataway, New Jersey IEEE 2004
• Edition: First edition
• Subjects: Applied sciences; Circuit noise; Circuit properties; Circuit testing; Cosmic rays; DH-HEMTs; Electric, optical and optoelectronic circuits; Electricity supply industry; Electronic circuits; Electronics; Exact sciences and technology; Flip-flops; Latches; Logic circuits; Neutrons; Switching, multiplexing, switched capacity circuits; Voltage; Radiation effect; Cosmic ray; Latch circuit
• ISBN: 0780382676; 9780780382671
• ISSN: 0193-6530; 2376-8606
• DOI: 10.1109/ISSCC.2004.1332809

A cosmic-ray immune latch circuit is presented. The storage node is separated into three electrodes, and the soft error on one node can be corrected by the other two, even if there is a large and long-lasting influx of radiation-induced charges. The circuit is proved to have significant tolerance by utilizing a test chip.