GaAs on 200 mm Si wafers via thin temperature graded Ge buffers by molecular beam epitaxy
For heterogeneous integration of III-V compound materials on 200 mm Si wafers, we present a complete in-situ molecular beam epitaxy (MBE) process from a Ge strain compensating buffer on Si to GaAs heteroepitaxy. The whole growth process, including high-k gate oxide deposition, is performed in a 200...
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Published in: | Journal of crystal growth Vol. 323; no. 1; pp. 387 - 392 |
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Main Authors: | , , , , , , , , , , |
Format: | Conference Proceeding Journal Article |
Language: | English |
Published: |
Amsterdam
Elsevier
15-05-2011
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Subjects: | |
Online Access: | Get full text |
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Summary: | For heterogeneous integration of III-V compound materials on 200 mm Si wafers, we present a complete in-situ molecular beam epitaxy (MBE) process from a Ge strain compensating buffer on Si to GaAs heteroepitaxy. The whole growth process, including high-k gate oxide deposition, is performed in a 200 mm MBE cluster tool. Thin (=0.3 [micro]m), temperature-graded Ge buffers are investigated and the influence of the substrate temperature during Ge nucleation and anneals is studied. Using such a buffer, GaAs was grown on 200 mm Si wafers and characterized structurally and electrically using MOS capacitors. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0022-0248 1873-5002 |
DOI: | 10.1016/j.jcrysgro.2010.12.002 |