Multifrequency ESR Characterization of Paramagnetic Point Defects in Semiconducting Cubic BN Crystals

• Published in: Applied magnetic resonance Vol. 39; no. 1-2; pp. 87 - 101
• Main Authors: Nistor, S. V., Stefan, M., Ghica, D., Goovaerts, E.
• Format: Journal Article
• Language: English
• Published: Vienna Springer Vienna 01-10-2010; Springer Nature B.V
• Subjects: Atoms and Molecules in Strong Fields; Boron; Crystal defects; Crystallites; Cubic boron nitride; Electron paramagnetic resonance; Electron spin; Electrons; Investigations; Laser Matter Interaction; Organic Chemistry; Photosensitivity; Physical Chemistry; Physical properties; Physics; Physics and Astronomy; Point defects; Single crystals; Solid State Physics; Spectroscopy/Spectrometry; Spin resonance; Superhigh frequencies; Temperature; Thin films; Paramagnetic Center; Electron Spin Resonance Signal; Electron Spin Resonance; Electron Spin Resonance Spectrum; Electron Spin Resonance Line
• ISSN: 0937-9347; 1613-7507
• DOI: 10.1007/s00723-010-0136-x

Low-frequency (X-band) electron spin resonance (ESR) investigations on commercially available large-grained cubic boron nitride (cBN) superabrasive powders of various coloration, combined with high-frequency (W-band) ESR measurements on oriented submillimeter-size single crystallites selected from the same powder samples, resulted in a clear identification of several types of paramagnetic point defects. The resulting spin Hamiltonian parameters describing the ESR spectra observed in the 3–293 K temperature range and the photosensitivity of the paramagnetic defects observed in amber-colored cBN samples are reported. It is shown that the nature of the paramagnetic centers depends on the color of the investigated samples and that, in many cases, uncontrolled impurities seem to be involved in their structure.