System based on a ZVA-67 vector network analyzer for measuring high-frequency parameters of magnetic film structures

• Published in: Russian journal of nondestructive testing Vol. 53; no. 3; pp. 204 - 212
• Main Authors: Shcherbinin, S. V., Volchkov, S. O., Lepalovskii, V. N., Chlenova, A. A., Kurlyandskaya, G. V.
• Format: Journal Article
• Language: English
• Published: Moscow Pleiades Publishing 01-03-2017; Springer Nature B.V
• Subjects: Automation; Certification; Characterization and Evaluation of Materials; Chemistry and Materials Science; Detection; Electronic devices; Ferromagnetic materials; Magnetic films; Magnetic Methods; Materials Science; Multilayers; Nanostructure; Nondestructive testing; Structural Materials; Thin films; thin magnetic films; microwave radiation; vector network analysis; magnetic field sensors; EPR spectroscopy; ferromagnetic resonance
• ISSN: 1061-8309; 1608-3385
• DOI: 10.1134/S1061830917030093

Thin magnetic films and multilayers are widely used in electronic devices and sensor systems, including systems for magnetic nondestructive testing and magnetic biodetection. Creating sensing elements of a new generation will necessitate the certification of film nanostructures. In this paper, a novel system is presented that allows automated measurement of parameters of thin ferromagnetic film structures at frequencies of 0.1 to 25 GHz in a magnetic field of up to 18 kOe.