Monopolar Resistive Switching in Diamond-Like Carbon Films

Current–voltage characteristics were studied for Pt/diamond-like C/Pt structures based on thin (20 nm) diamond-like carbon films, when the ratio between carbon phases with sp 2 and sp 3 hybridization was controlled by the film growth conditions at the high-frequency diode sputtering method. The effe...

Full description

Saved in:
Bibliographic Details
Published in:Semiconductors (Woodbury, N.Y.) Vol. 53; no. 14; pp. 1970 - 1973
Main Authors: Vedeneev, A. S., Luzanov, V. A., Rylkov, V. V.
Format: Journal Article
Language:English
Published: Moscow Pleiades Publishing 01-12-2019
Springer
Springer Nature B.V
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Current–voltage characteristics were studied for Pt/diamond-like C/Pt structures based on thin (20 nm) diamond-like carbon films, when the ratio between carbon phases with sp 2 and sp 3 hybridization was controlled by the film growth conditions at the high-frequency diode sputtering method. The effects of resistive switching from the initial high-resistive state to a low-resistive state at an applied voltage of V ~ 3 V and reverse switching at V ~ 0 are detected. These effects are symmetric with respect to change in voltage polarity and are associated with the change in the hybridization type of local carbon regions, which causes switching from the high- to low-resistive state in strong (~10 6 V/cm) fields because of sp 3 → sp 2 transitions and reverse switching in the field absence. The high-to-low resistance ratio reaches ~50.
ISSN:1063-7826
1090-6479
DOI:10.1134/S1063782619140252