Analysis of reliability of semiconductor emitters with different designs of cavities

We have reported on the results of analysis of the operating time of conventional laser diodes and diodes with noninjecting output sections. The reasons for shorter operating time of diodes with a single anti-reflection face of the cavity compared to diodes with two protecting coatings and emitters...

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Bibliographic Details
Published in:	Technical physics Vol. 61; no. 10; pp. 1525 - 1530
Main Authors:	Ivanov, A. V., Kurnosov, V. D., Kurnosov, K. V., Kurnyavko, Yu. V., Lobintsov, A. V., Meshkov, A. S., Penkin, V. N., Romantsevich, V. I., Uspenskii, M. B., Chernov, R. V.
Format:	Journal Article
Language:	English
Published:	Moscow Pleiades Publishing 01-10-2016 Springer Springer Nature B.V
Subjects:	Analysis Classical and Continuum Physics Coatings Emitters Holes Lasers LEDs Physics Physics and Astronomy Protective coatings Reliability analysis Repair & maintenance Semiconductor lasers Solid State Electronics
Online Access:	Get full text
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Summary:	We have reported on the results of analysis of the operating time of conventional laser diodes and diodes with noninjecting output sections. The reasons for shorter operating time of diodes with a single anti-reflection face of the cavity compared to diodes with two protecting coatings and emitters equipped with a fiber Bragg grating have been considered.
ISSN:	1063-7842 1090-6525
DOI:	10.1134/S1063784216100157