Images of the Antiferromagnetic Structure of a NiO(100) Surface by Means of X-Ray Magnetic Linear Dichroism Spectromicroscopy

Images of the Antiferromagnetic Structure of a NiO(100) Surface by Means of X-Ray Magnetic Linear Dichroism Spectromicroscopy

We present the first images of a surface showing clear antiferromagnetic contrast. The images were obtained for 10[endash]80thinspthinspnm thick NiO(100) films grown on Mg(100) by means of x-ray magnetic linear dichroism spectroscopy in conjunction with high resolution photoelectron emission microsc...

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Bibliographic Details
Published in:Physical review letters Vol. 83; no. 9; pp. 1862 - 1865
Main Authors: Stöhr, J., Scholl, A., Regan, T. J., Anders, S., Lüning, J., Scheinfein, M. R., Padmore, H. A., White, R. L.
Format: Journal Article
Language:English
Published: United States 01-08-1999
Subjects:
665100 > Nuclear Techniques in Condensed Matter Physics > (1992-)
ADVANCED LIGHT SOURCE
ANTIFERROMAGNETIC MATERIALS
CHALCOGENIDES
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
DICHROISM
ELECTROMAGNETIC RADIATION
ELECTRON SPECTROSCOPY
IONIZING RADIATIONS
MAGNETIC MATERIALS
MATERIALS
MATERIALS SCIENCE
MICROSCOPY
NEEL TEMPERATURE
NICKEL COMPOUNDS
NICKEL OXIDES
OXIDES
OXYGEN COMPOUNDS
PHOTOELECTRON SPECTROSCOPY
PHYSICAL PROPERTIES
RADIATION SOURCES
RADIATIONS
SPECTROSCOPY
STRUCTURAL CHEMICAL ANALYSIS
SURFACE PROPERTIES
SYNCHROTRON RADIATION SOURCES
TEMPERATURE DEPENDENCE
THERMODYNAMIC PROPERTIES
THIN FILMS
TRANSITION ELEMENT COMPOUNDS
TRANSITION TEMPERATURE 360202 > Ceramics, Cermets, & Refractories > Structure & Phase Studies
X RADIATION
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Description
Summary:We present the first images of a surface showing clear antiferromagnetic contrast. The images were obtained for 10[endash]80thinspthinspnm thick NiO(100) films grown on Mg(100) by means of x-ray magnetic linear dichroism spectroscopy in conjunction with high resolution photoelectron emission microscopy. The surface sensitive images with a lateral resolution of better than 50thinspthinspnm reveal surface line defects that exhibit antiferromagnetic order with a reduced N[acute e]el temperature (455thinspthinspK) relative to the rest of the film surface and the bulk (523thinspthinspK). Analysis of the temperature dependent images allows us to separate the spin and charge components of the linear dichroism effect. [copyright] [ital 1999] [ital The American Physical Society ]
Bibliography:None
ISSN:0031-9007
1079-7114
DOI:10.1103/PhysRevLett.83.1862