Laser tests of silicon detectors

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 573; no. 1; pp. 12 - 15
• Main Authors: Doležal, Zdeněk, Escobar, Carlos, Gadomski, Szymon, Garcia, Carmen, Gonzalez, Sergio, Kodyš, Peter, Kubík, Petr, Lacasta, Carlos, Marti, Salvador, Mitsou, Vasiliki A., Moorhead, Gareth F., Phillips, Peter W., Řezníček, Pavel, Slavík, Radan
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01-04-2007
• Subjects: Laser tests; Semiconductor detectors; 29.40.W; 81.70; Semiconductor detectors; 42.87; Laser tests
• ISSN: 0168-9002; 1872-9576
• DOI: 10.1016/j.nima.2006.10.319

This paper collects experiences from the development of a silicon sensor laser testing setup and from tests of silicon strip modules (ATLAS End-cap SCT), pixel modules (DEPFET) and large-area diodes using semiconductor lasers. Lasers of 1060 and 680
nm wavelengths were used. A sophisticated method of focusing the laser was developed. Timing and interstrip properties of modules were measured. Analysis of optical effects involved and detailed discussion about the usability of laser testing for particle detectors are presented.