Direct measurements of field-induced strain at magnetoelectric interfaces by grazing incidence x-ray diffraction

• Published in: Applied physics letters Vol. 102; no. 1
• Main Authors: Abes, M., Koops, C. T., Hrkac, S. B., Greve, H., Quandt, E., Collins, S. P., Murphy, B. M., Magnussen, O. M.
• Format: Journal Article
• Language: English
• Published: 07-01-2013
• Subjects: Diffraction; Grazing incidence; Magnetic fields; Magnetostriction; Piezoelectricity; Saturation; Strain; X-rays
• ISSN: 0003-6951; 1077-3118
• DOI: 10.1063/1.4773358

The magnetic field induced strain at the interface of a magnetoelectric composite, consisting of a ZnO(001) piezoelectric substrate and an amorphous (Fe90Co10)78Si12B10 magnetostrictive layer, was directly determined by grazing incidence X-ray diffraction. Upon applying a magnetic field along the [110] direction, the ZnO single crystal is under tensile strain in [110] direction and compressive strain in [1-10] direction, in agreement with the magnetostriction in the (Fe90Co10)78Si12B10 layer. At room temperature, the saturation strain along [1-10] of about 3 × 10−5 is close to the saturation magnetostriction of the film measured with the cantilever bending technique.