Mueller-matrix characterization of liquid crystals

Mueller-matrix characterization of liquid crystals

Generalized spectroscopic ellipsometry (g-SE) has been applied to many anisotropic materials. This measurement is based on the 2×2 Jones matrix sample representation, which is often sufficient. However, when the reflected or transmitted light becomes sufficiently depolarized, the Mueller-matrix (MM)...

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Bibliographic Details
Published in:Thin solid films Vol. 455; pp. 591 - 595
Main Authors: Hilfiker, J.N., Herzinger, C.M., Wagner, T., Marino, Antigone, Delgais, Guiseppe, Abbate, Giancarlo
Format: Journal Article
Language:English
Published: Elsevier B.V 01-05-2004
Subjects:
Anisotropy
Generalized ellipsometry
Liquid crystals
Mueller matrix
Mueller matrix
Generalized ellipsometry
Anisotropy
Liquid crystals
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Summary:Generalized spectroscopic ellipsometry (g-SE) has been applied to many anisotropic materials. This measurement is based on the 2×2 Jones matrix sample representation, which is often sufficient. However, when the reflected or transmitted light becomes sufficiently depolarized, the Mueller-matrix (MM) representation may be required for anisotropic materials characterization. We report measurements of a 33.85 μm thick liquid crystal layer sandwiched between two glass substrates. In addition to the sample anisotropy, the measurement is significantly depolarized. Mueller-matrix measurements are acquired in transmission as a function of wavelength, angle of incidence, and sample orientation to characterize the liquid crystal layer. Experimental measurements allow characterization of the liquid crystal anisotropy and orientation.
ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2004.02.011