Linewidths of phonon lines of natural and synthetic diamonds

Linewidths of phonon lines of natural and synthetic diamonds

Raman scattering has been used to measure phonon linewidths and frequencies of a number of high quality diamond crystals. It was found that the defect induced broadening produced a Lorentzian line shape. The smallest Lorentzian linewidth of 1.68 cm−1 at 300 K caused by anharmonicity and defects was...

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Bibliographic Details
Published in:Applied physics letters Vol. 65; no. 13; pp. 1641 - 1643
Main Authors: Kirillov, D., Reynolds, G. J.
Format: Journal Article
Language:English
Published: 26-09-1994
Online Access:Get full text
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Summary:Raman scattering has been used to measure phonon linewidths and frequencies of a number of high quality diamond crystals. It was found that the defect induced broadening produced a Lorentzian line shape. The smallest Lorentzian linewidth of 1.68 cm−1 at 300 K caused by anharmonicity and defects was obtained for the high pressure synthesized diamond. The linewidths of the diamonds grown by chemical vapor deposition varied, with the best sample having a linewidth of 2.31 cm−1, close to the values for natural diamonds. No measurable phonon frequency shift caused by defects was found.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.112936