Legal Metrology and System for Calibration and Verification of the Radar Level Sensors

• Published in: Kvalita inovácia prosperita Vol. 20; no. 1; p. 95
• Main Authors: Markovič, Jaromír, Mihok, Jozef, Ďuriš, Stanislav, Schreier, Zbyněk
• Format: Journal Article
• Language: English
• Published: Trencin Technical University of Kosice 01-01-2016
• Subjects: Accuracy; legal metrology; measurement accuracy; measuring instrument; Measuring instruments; R&D; radar level gauges; Research & development; uncertainty; Slovakia
• ISSN: 1335-1745; 1335-1745
• DOI: 10.12776/qip.v20i1.694

Purpose: The paper deals with the legal metrology that is principally responsible for assuring the uniformity and correctness of measurements and presents the results of the scientific and research work in the cross-disciplinary fields. The design of the new measuring system for the verification of the radar level gauges.
Methodology/Approach: The requirements on performing verification of the measuring instruments are changed significantly, especially the requirement for reducing the time necessary for putting the measuring instruments out of service. Slovak legal metrology (SLM) has developed a number of its own systems for verification of the legally controlled measuring instruments.
Findings: The paper presents the results of the research activities aimed to refine and improve metrological continuity and metrological control of selected types of measuring instruments.
Research Limitation/implication: This paper are based on the theoretical and practical knowledge from the field of metrology, the analysis of the legislative and normative requirements on the measuring instruments metrological assurance, and knowledge gathered during the practical performance of the measuring instruments metrological control.
Originality/Value of paper: In the paper, there are presented those results of solving the tasks in the research and development fields that lead to the higher measurement accuracy, and to the elimination of the undesired influences that may occur during a measurement.