On a modified projection scheme of the least-squares method for the modeling of the distribution of minority charge carriers generated by an electron beam in a homogeneous semiconductor material

On a modified projection scheme of the least-squares method for the modeling of the distribution of minority charge carriers generated by an electron beam in a homogeneous semiconductor material

A modified projection scheme of the least-squares method is considered for modeling of the distribution of minority charge carriers generated by an electron beam in a homogeneous semiconductor material. The order estimate is given, and the condition for the computational stability of the proposed mo...

Full description

Saved in:
Bibliographic Details
Published in:Surface investigation, x-ray, synchrotron and neutron techniques Vol. 7; no. 6; pp. 1077 - 1080
Main Authors: Seregina, E. V., Stepovich, M. A., Makarenkov, A. M.
Format: Journal Article
Language:English
Published: Moscow Pleiades Publishing 01-11-2013
Subjects:
Chemistry and Materials Science
Materials Science
Surfaces and Interfaces
Thin Films
Neutron Technique
Electron Beam
Collective Motion
Projection Method
Surface Investigation
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:A modified projection scheme of the least-squares method is considered for modeling of the distribution of minority charge carriers generated by an electron beam in a homogeneous semiconductor material. The order estimate is given, and the condition for the computational stability of the proposed modified projection scheme is obtained in the form of the limiting relation.
ISSN:1027-4510
1819-7094
DOI:10.1134/S1027451013060177