A new waveform analysis technique to extract good energy and position resolution from a dual-axis duo-lateral position-sensitive detector

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 985; no. C; p. 164674
• Main Authors: Aslin, M.W., Hannaman, A., Youngs, M.D., McIntosh, A.B., Abbott, A., Adamson, P., Gauthier, J., Hagel, K., Jedele, A., Lui, Y.-W., McIntosh, L.A., Sorensen, M.Q., Tobin, Z.N., Wada, R., Wakhle, A., Yennello, S.J.
• Format: Journal Article
• Language: English
• Published: Netherlands Elsevier B.V 01-01-2021; Elsevier
• Subjects: Charged particle; Position-sensitive; Silicon; Silicon; Position-sensitive; Charged particle
• ISSN: 0168-9002; 1872-9576
• DOI: 10.1016/j.nima.2020.164674

The dual-axis duo-lateral position-sensitive silicon detector was developed to detect charged particles with high quality position and energy resolution. When these detectors were used with conventional signal processing electronics, an empirically determined correction was used to improve energy resolution. In this work, the waveforms from the detector after preamplification are studied in detail to investigate position information contained in the waveforms. A 7.22 MeV/nucleon alpha particle beam was impinged directly on a masked dual-axis duo-lateral detector. Data obtained using a 228Th alpha particle source was also used. By studying the waveform characteristics that give rise to the position-dependent distortions, a new summed trigger analysis method has been developed to significantly improve linearity in position reconstruction without sacrificing energy resolution.