Conductance measurement of a DNA network in nanoscale by point contact current imaging atomic force microscopy

• Published in: Applied physics letters Vol. 86; no. 11; pp. 113901 - 113901-3
• Main Authors: Terawaki, Ayumu, Otsuka, Yoichi, Lee, HeaYeon, Matsumoto, Takuya, Tanaka, Hidekazu, Kawai, Tomoji
• Format: Journal Article
• Language: English
• Published: American Institute of Physics 14-03-2005
• ISSN: 0003-6951; 1077-3118
• DOI: 10.1063/1.1886265

We measured the electrical conductivity of a DNA network as a spatially-resolved current-image using point-contact current imaging atomic force microscopy (PCI-AFM) under various humidity conditions. The simultaneous observation of topography and current image by PCI-AFM can provide information pertaining to the electrical properties of biological and∕or soft materials in the nano-scale range. Under dry condition (0% humidity), no difference was observed for the electrical current both of the DNA network and mica surface, whereas the electrical current along the DNA network was larger than that of the mica surface by
20
pA
at a bias voltage of
5
V
under high humidity conditions of 60%.