A comparison of grain boundary topography and dislocation network structure in bulk-scale [001] tilt bicrystals of Bi2Sr2CaCu2O8+x and YBa2Cu3O7-δ

• Published in: Physica. C, Superconductivity Vol. 306; no. 3-4; pp. 163 - 187
• Main Authors: TSU, I.-F, WANG, J.-L, KAISER, D. L, BABCOCK, S. E
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier Science 20-09-1998
• Subjects: Bi-based cuprates; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Cuprates superconductors (high tc and insulating parent compounds); Defects and impurities in crystals; microstructure; Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.); Exact sciences and technology; Grain and twin boundaries; High-Tc compounds; Physics; Structure of solids and liquids; crystallography; Superconductivity; Y-based cuprates; Grain boundaries; Polarizing microscope; Inorganic compounds; Bicrystals; Electron diffraction; Tilt boundaries; Partial dislocation; Burgers vector; Nanometer scale; Optical microscopy; Topography; High-Tc superconductors; Defect structure; Facet; Transition element compounds; Dislocation structure; Bismuth oxides; Experimental study; High-resolution methods; Calcium oxides; Grain boundary misorientation; Strontium oxides; Multi-element compounds; Copper oxides; TEM; Yttrium oxides
• ISSN: 0921-4534; 1873-2143
• DOI: 10.1016/S0921-4534(98)00361-X