Preferred orientation in PbZrO3 thin film prepared by sol-gel technique

• Published in: Materials research bulletin Vol. 35; no. 14-15; pp. 2245 - 2251
• Main Authors: BAE, Se-Hwan, JEON, Kie-Beom, JIN, Byungmoon
• Format: Journal Article
• Language: English
• Published: London Elsevier Science 01-11-2000; Amsterdam
• Subjects: Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids); Materials science; Methods of deposition of films and coatings; film growth and epitaxy; Physics; Structure and morphology; thickness; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology; Temperature dependence; Atomic force microscopy; Inorganic compounds; Crystal orientation; XRD; Experimental study; Preferred orientation; Lead zirconates; Thin films; Morphology; Zirconates; Crystal growth from solutions; Thermal annealing; Sol-gel process
• ISSN: 0025-5408; 1873-4227
• DOI: 10.1016/S0025-5408(00)00443-8