Characterization of CNx films by X-ray emission measurements

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Bibliographic Details
Published in:	Thin solid films Vol. 402; no. 1-2; pp. 60 - 64
Main Authors:	Kurmaev, E.Z, Moewes, A, Winarski, R.P, Shamin, S.N, Ederer, D.L, Feng, J.Y, Turner, S.S
Format:	Journal Article
Language:	English
Published:	United States 01-01-2002
Subjects:	ADVANCED LIGHT SOURCE ADVANCED LIGHT SOURCE ALS LAWRENCE BERKELEY LABORATORY PARTICLE ACCELERATORS X-RAY EMISSION ANALYSIS
Online Access:	Get full text
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Description
Bibliography:	AC03-76SF00098 LBNL/ALS-43848 US Department of Energy (US)
ISSN:	0040-6090 1879-2731
DOI:	10.1016/S0040-6090(01)01686-8