A swept-field aspiration condenser as an ion-mobility spectrometer

A method is presented for using a small, low-cost, extremely simple device as an ion-mobility spectrometer. The device is a planar first-order differential aspiration condenser as described by Puumalainen, but in this case the electric field is not kept constant but is swept in discrete nonuniform s...

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Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement Vol. 47; no. 3; pp. 769 - 775
Main Authors: Sacristan, E., Solis, A.A.
Format: Journal Article
Language:English
Published: IEEE 01-06-1998
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Summary:A method is presented for using a small, low-cost, extremely simple device as an ion-mobility spectrometer. The device is a planar first-order differential aspiration condenser as described by Puumalainen, but in this case the electric field is not kept constant but is swept in discrete nonuniform steps. The result is a characteristic I(V) curve that is a function of the ion-mobility density function of the gas sample flowing through the condenser. A discrete transform is introduced, based on the equations of Tammet describing the operation of aspiration condensers, that converts the I(V) curve into the ion-mobility density spectrum and vice versa. Both the device and the method are described in theoretical detail. The method is illustrated with computer simulations and experimental data using both a prototype aspiration condenser and a conventional drift tube ion-mobility spectrometer. The results suggest this method is an attractive alternative for ion-mobility gas analysis applications.
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ISSN:0018-9456
1557-9662
DOI:10.1109/19.744345